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Patents
A method and system for more accurate characterization of semiconductors.
A method and system for more accurate characterization of semiconductors. Continuation in part of US Patent 9,002,677.
A method and system for more accurate characterization of semiconductors. Continuation in part of US Patent 9,002,677 and US Patent 10,352,989.
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Parties interested in licensing any of the applications above please contact Raja Technologies Inc.
The following Raja Technologies Inc. products are protected by patents in the U.S. and elsewhere. This website is provided to satisfy the virtual patent marking provisions of various jurisdictions including the virtual patent marking provisions of the America Invents Act. The following list of Raja Technologies Inc. products may not be all inclusive, and other Raja Technologies Inc. products not listed here may be protected by one or more patents.
Probabilyze™
Protected by US Patent 9,002,677, US Patent 10,352,989 and US Patent 10,564,215. Additional patents may be pending in the U.S. and elsewhere.
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